Product Detail

SCANNING ELECTRON MICROSCOPE

Model: IT 210 LA 

Brand: JEOL - Japan

Scanning electron microscope (SEM), Model: IT 210 LA of Jeol Company have  the following outstanding features:

- Scanning electron microscope (SEM) product line is easy to use while maintaining superior features and expandability

- The software integrates multi-touch control features for efficient and user-friendly operation

- Large and eucentric sample chamber helps to easily control samples when working with large specimens or even in laboratories with a large number of samples.

- Integrating continuous analysis technology and simultaneous SEM images with EDS detector is convenient for surveying the area to be analyzed and increasing the accuracy of analysis techniques.

- Direct magnification (real): 5 times to 300,000 times

- Display magnification: 15 times to 883,652 times

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